FIT2015第14回情報科学技術フォーラム 開催日:2015年9月15日(火)~17日(木) 会場:愛媛大学城北キャンパス
抄録
RC-010
A Method for Aging Estimation of CMOS Circuits Using Ring Oscillators
三浦幸也・池田龍史(首都大)
NBTI, PBTI, and CHC aging occurs in nanoscale transistors and is one of the factors that degrades the performance of LSIs. Aging decreases the operating speed of a transistor, causing the LSI to ultimately malfunction due to increment in the signal propagation delay time. This paper presents a method for estimating the amount of increment in the delay time of an LSI and a method for estimating the amount of increment in the threshold voltage per transistor from the changes in the period of two ring oscillators by aging. Results of circuit simulations showed that the proposed methods can perform estimations with an error rate of less than 4.6 % for the delay time increment and less than 0.6 % for the threshold voltage increment.