Call For Papers: SAINT2008 Workshop on Heuristic Methods for the Design, Deployment, and Reliability of Networks and Network Applications (HEUNET 2008) Theme of the Workshop: The widespread of the internet has given further opportunities for providing new services and web-based applications. However, such applications are often accompanied by a high complexity, and the number of standards, to which an application must follow, is rapidly increasing. Representing related problems as optimization problems will often not find an exact analytical solution anymore, and the need for advanced heuristic techniques becomes prevalent. Heuristic techniques provide a wealth of methods to handle tasks in complex application domains. Among such techniques we can find evolutionary computation, tabu search, simulated annealing, as well as many hybrid and ensemble approaches and others. This workshop will focus on heuristic methods to tangent the needs of modern internet-based applications and their underlying networking layer. It is supposed to bring together researchers from different communities with the similar need, and to provide a base for scientific exchange of research ideas. Topics of interest are, among other, heuristic methods for - network design - handling networking problems by graph theory - QoS solutions - modeling of network-based services - scaling of networks - human-machine interface - digital convergence - user modeling - network bottleneck identification - efficient content delivery schemes - service authentication and authorization schemes - service scheduling - network security - service and content retrieval and ranking - debugging of internet-based applications Papers and Author's Kit: Workshop papers should be within 4 pages, no extra page is allowed. The Proceedings of the Symposium and the Workshops will be published, in separated volumes, by the IEEE Computer Society Press. Please follow the instruction on the web below where authors can find Page Form and appropriate pointers for LaTeX Macros. http://www.icta.ufl.edu/saint08/ > Information for Authors Paper Submission: Papers should be submitted on-line no later than March 1, 2008. The submission site can be reached at http://heunet08.softcomputing.org/openconf After a review process by Organizers and Program Committee of the Workshop, authors of accepted papers will be requested to send its final manuscript to IEEE-CS press no later than May 1, 2008. So, authors are kindly requested to submit papers as early as possible to facilitate a review process. Important Dates: Workshop Paper Submission: March 1, 2008 Workshop Paper Notification: March 30, 2008 Workshop Final Manuscript: May 1, 2008 Workshop: Jul 28 - Aug 1, 2008 (exact date is TBD) Registration: It is the IEEE policy that accepted papers can be published only when IEEE recognized that at least one author has registered for presentation. So, authors will be requested to register along with the final manuscript. SAINT Conference Registration fees include a copy of the Conference proceedings, a copy of the Workshop proceedings, and admission to the Conference/Workshop sessions. Note: The date and length (a full or half day) of the Workshop will be decided by SAINT2008 Organizing Committee taking account of the number submitted of papers, and be notified on the SAINT2008 web. Please also note that, according to the SAINT2008 Organizing Committee, the Workshop is subject to cancellation when the number submitted of papers will not be enough. Organizer(s): Dr. Mario KÖPPEN Kyushu Institute of Technology 680-4, Kawazu, Iizuka, Fukuoka 820-8502 Japan Email: mkoeppen@ieee.org Phone: +81 948 29 7626 Fax: +81 948 29 7601 Prof. Günther RAIDL Vienna University of Technology Favoritenstraße 9-11 / 1861 A-1040 Vienna, Austria Email: raidl@ads.tuwien.ac.at Phone: +43-1-58801-18616 Fax: +43-1-58801-18699 Program Committee for Paper Review: Christian Blum, Universitat Politècnica de Catalunya, Spain Bryant A. Julstrom, St. Cloud State University, USA Petrica Pop, North University of Baia Mare, Romania Mauricio Resende, AT&T Labs Research, USA Franz Rothlauf, Johannes Gutenberg Universität Mainz, Germany Kei Ohnishi, Kyushu Institute of Technology, Japan Thomas Weise, Universität Kassel, Germany Jens Gottlieb, SAP AG, Germany